000			01072nmm a22003135u 4500
999			_c15273 _d15273
005			20200827185440.0
008			100301s2008 xx j eng d
020			_a9781402083631
050	0	4	_aTK7871.99.M44 _bP38 2008
100	1		_aPavlov, Andrei.
245	1	0	_aCMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies _h[electronic resource] : _bProcess-Aware SRAM Design and Test / _cby Andrei Pavlov, Manoj Sachdev.
250			_a1a ed.
260			_aDordrecht : _bSpringer Netherlands, _c2008.
300			_bv.: digital
490		0	_aFrontiers In Electronic Testing, _v40 _x0929-1296 ;
650		4	_aSemiconductores complementarios de óxido metálico _xDiseño
650		4	_aMemoria de acceso aleatorio
650		4	_aNanoelectrónica
700	1		_aSachdev, Manoj.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4020-8363-1
942			_2lcc _cLIE