| 000 | 01356nmm a22003855u 4500 | ||
|---|---|---|---|
| 005 | 20210222145127.0 | ||
| 008 | 100301s2007 xx j eng d | ||
| 020 | _a9780387329895 | ||
| 050 | 0 | 4 |
_aTK7874 _bS84 2007 |
| 100 | 1 | _aSuhir, E. | |
| 245 | 1 | 0 |
_aMicro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging _h[electronic resource] / _cedited by E. Suhir, Y. C. Lee, C. P. Wong. |
| 260 |
_aBoston, MA : _bSpringer Science+Business Media, LLC, _c2007. |
||
| 300 | _bv.: digital | ||
| 650 | 0 | _aEngineering | |
| 650 | 0 | _aParticles (Nuclear physics) | |
| 650 | 0 | _aEngineering design | |
| 650 | 0 | _aSystem safety | |
| 650 | 0 | _aElectronics | |
| 650 | 0 | _aOptical materials | |
| 650 | 0 | _aSurfaces (Physics) | |
| 650 | 1 | 4 | _aEngineering |
| 650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation |
| 650 | 2 | 4 | _aOptical and Electronic Materials |
| 650 | 2 | 4 | _aEngineering Design |
| 650 | 2 | 4 | _aSolid State Physics and Spectroscopy |
| 650 | 2 | 4 | _aSurfaces and Interfaces, Thin Films |
| 650 | 2 | 4 | _aQuality Control, Reliability, Safety and Risk |
| 700 | 1 | _aLee, Y. C. | |
| 700 | 1 | _aWong, C. P. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/0-387-32989-7 |
| 942 |
_2lcc _cLIE |
||
| 999 |
_c17444 _d17444 |
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