| 000 | 01199nmm a22003735u 4500 | ||
|---|---|---|---|
| 999 |
_c25851 _d25851 |
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| 005 | 20200623223825.0 | ||
| 008 | 100715s2008 xx j eng d | ||
| 020 | _a9780387757285 | ||
| 050 | 0 | 4 |
_aTK7874 _bT44 2008 |
| 100 | 1 | _aTehranipoor, Mohammad. | |
| 245 | 1 | 0 |
_aNanometer Technology Designs High-Quality Delay Tests _h[electronic resource] / _cby Mohammad Tehranipoor, Nisar Ahmed. |
| 250 | _a1a ed. | ||
| 260 |
_aBoston, MA : _bSpringer US, _c2008. |
||
| 300 | _bv.: digital | ||
| 650 | 0 | _aEngineering | |
| 650 | 0 |
_aCircuitos integrados _xPruebas |
|
| 650 | 0 |
_aCircuitos integrados _xIntegración a muy gran escala. |
|
| 650 | 0 | _aNanotecnología | |
| 700 | 1 | _aAhmed, Nisar. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-0-387-75728-5 |
| 942 |
_2lcc _cLIE |
||