Transmission Electron Microscopy and Diffractometry of Materials - Fultz, Brent; Howe, James M.; SpringerLink (Online service) (Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008)
Keywords: Chemistry; Particles (Nuclear physics); Crystallography; Surfaces (Physics); Chemistry; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films; Crystallography; Solid State Physics and Spectroscopy; Physics and Applied Physics in Engineering