CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms - Li, Flora M.; Nathan, Arokia; SpringerLink (Online service) (Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005)
Keywords: Chemistry; Spectrum analysis; Electronics; Optical materials; Chemistry; Optical and Electronic Materials; Optical Spectroscopy, Ultrafast Optics; Physics and Applied Physics in Engineering; Electronics and Microelectronics, Instrumentation