Alford, Terry L. <br/><br/>
Fundamentals of Nanoscale Film Analysis  [electronic resource] / 
by Terry L. Alford, Leonard C. Feldman, James W. Mayer. 
 - Boston, MA :  Springer Science+Business Media, Inc.,  2007. 
 -  v.: digital 
<br/><br/><label>ISBN: </label>9780387292618 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Chemistry<br/>Condensed matter<br/>Particles (Nuclear physics)<br/>Electronics<br/>Nanotechnology<br/>Surfaces (Physics)<br/>Chemistry<br/>Characterization and Evaluation of Materials<br/>Surfaces and Interfaces, Thin Films<br/>Nanotechnology<br/>Solid State Physics and Spectroscopy<br/>Condensed Matter<br/>Electronics and Microelectronics, Instrumentation
<br/><br/><label>LC Class. No.: </label>QC176.83  / A44 2007