000			01316nmm a22003735u 4500
999			_c14999 _d14999
005			20200805213806.0
008			100301s2006 xx j eng d
020			_a9781402053153
050	0	4	_aTK7874.58 _bS26 2006
100	1		_aSánchez, Gloria Huertas.
245	1	0	_aOscillation-Based Test in Mixed-Signal Circuits _h[electronic resource] / _cby Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz.
260			_aDordrecht : _bSpringer, _c2006.
300			_bv.: digital
440		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v36
650		0	_aEngineering
650		0	_aEngineering design
650		0	_aElectronics
650		0	_aSystems engineering
650	1	4	_aEngineering
650	2	4	_aCircuits and Systems
650	2	4	_aElectronic and Computer Engineering
650	2	4	_aEngineering Design
650	2	4	_aElectronics and Microelectronics, Instrumentation
700	1		_aGarcía de la Vega, Diego Vázquez.
700	1		_aRueda, Adoración Rueda.
700	1		_aDíaz, José Luis Huertas.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
856	4	0	_uhttp://dx.doi.org/10.1007/1-4020-5315-0
942			_2lcc _cLIE