000			01268nmm a22003615u 4500
999			_c23737 _d23737
005			20201031230132.0
008			100301s2006 xx j eng d
020			_a9780387346090
050	0	4	_aTK7895.E42 _bS55 2006
100	1		_aSilva, Francisco.
245	1	4	_aThe Core Test Wrapper Handbook _h[electronic resource] : _bRationale and Application of IEEE Std. 1500™ / _cby Francisco Silva, Teresa McLaurin, Tom Waayers.
260			_aBoston, MA : _bSpringer Science+Business Media, LLC, _c2006.
300			_bv.: digital
440		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v35
650		0	_aEngineering
650		0	_aComputer aided design
650		0	_aElectronics
650		0	_aSystems engineering
650	1	4	_aEngineering
650	2	4	_aCircuits and Systems
650	2	4	_aComputer-Aided Engineering (CAD, CAE) and Design
650	2	4	_aElectronics and Microelectronics, Instrumentation
650	2	4	_aElectronic and Computer Engineering
700	1		_aMcLaurin, Teresa.
700	1		_aWaayers, Tom.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
856	4	0	_uhttp://dx.doi.org/10.1007/0-387-34609-0
942			_2lcc _cLIE