CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Pavlov, Andrei.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test / [electronic resource] : by Andrei Pavlov, Manoj Sachdev. - 1a ed. - Dordrecht : Springer Netherlands, 2008. - v.: digital - Frontiers In Electronic Testing, 40 0929-1296 ; .
9781402083631
Semiconductores complementarios de óxido metálico --Diseño
Memoria de acceso aleatorio
Nanoelectrónica
TK7871.99.M44 / P38 2008
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test / [electronic resource] : by Andrei Pavlov, Manoj Sachdev. - 1a ed. - Dordrecht : Springer Netherlands, 2008. - v.: digital - Frontiers In Electronic Testing, 40 0929-1296 ; .
9781402083631
Semiconductores complementarios de óxido metálico --Diseño
Memoria de acceso aleatorio
Nanoelectrónica
TK7871.99.M44 / P38 2008