Defects in High-k Gate Dielectric Stacks
Gusev, Evgeni.
Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices / [electronic resource] : edited by Evgeni Gusev. - 1a ed. - Dordrecht : Springer, 2006. - v.: digital - NATO Science Series II: Mathematics, Physics and Chemistry, 220 1568-2609 ; .
9781402043673
Engineering
Condensed matter
Electronics
Engineering
Electronic and Computer Engineering
Condensed Matter
Physics and Applied Physics in Engineering
Electronics and Microelectronics, Instrumentation
TK7895.G36 / G36 2006
Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices / [electronic resource] : edited by Evgeni Gusev. - 1a ed. - Dordrecht : Springer, 2006. - v.: digital - NATO Science Series II: Mathematics, Physics and Chemistry, 220 1568-2609 ; .
9781402043673
Engineering
Condensed matter
Electronics
Engineering
Electronic and Computer Engineering
Condensed Matter
Physics and Applied Physics in Engineering
Electronics and Microelectronics, Instrumentation
TK7895.G36 / G36 2006