Influence of temperature on microelectronics and system reliability / Pradeep Lall, Michael G. Pecht, Edward B. Hakim

By: Contributor(s): Material type: TextTextPublication details: Boca Raton, Florida : CRC, 1995Description: 307 p. ; 26 cmISBN:
  • 0-8493-9450-3
Subject(s): LOC classification:
  • TK7870.25 L35 1995
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Libro Libro Biblioteca del Posgrado en Ingeniería Eléctrica General TK787.25 L35 1995 (Browse shelf(Opens below)) C:1 Available PBIE000000860

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Incluye bibliografia e indice

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