Influence of temperature on microelectronics and system reliability / Pradeep Lall, Michael G. Pecht, Edward B. Hakim
Material type: TextPublication details: Boca Raton, Florida : CRC, 1995Description: 307 p. ; 26 cmISBN:- 0-8493-9450-3
- TK7870.25 L35 1995
Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Libro | Biblioteca del Posgrado en Ingeniería Eléctrica General | TK787.25 L35 1995 (Browse shelf(Opens below)) | C:1 | Available | PBIE000000860 |
1 ejem.
Rec. Prop. Esc.
Incluye bibliografia e indice
There are no comments on this title.