Lifetime Spectroscopy [electronic resource] : A Method of Defect Characterization in Silicon for Photovoltaic Applications / by Stefan Rein.
Material type: Computer fileSeries: Springer Series in Material Science ; 85Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005.Edition: 1a edDescription: v.: digitalISBN:- 9783540279228
- TK7871.15.S55 R45 2005
Item type | Current library | Call number | URL | Copy number | Status | Notes | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|---|
Libro Electrónico | Biblioteca Digital Colección Digital | TK7871.15.S55 R45 2005 (Browse shelf(Opens below)) | Link to resource | 1 | Available | SpringerLink | BDIG00008301 |
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