Lifetime Spectroscopy [electronic resource] : A Method of Defect Characterization in Silicon for Photovoltaic Applications / by Stefan Rein.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Springer Series in Material Science ; 85Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005.Edition: 1a edDescription: v.: digitalISBN:
  • 9783540279228
Subject(s): LOC classification:
  • TK7871.15.S55 R45 2005
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TK7871.15.S55 R45 2005 (Browse shelf(Opens below)) Link to resource 1 Available SpringerLink BDIG00008301

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