Applied Scanning Probe Methods II [electronic resource] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs.
Material type: Computer fileSeries: NanoScience and TechnologyPublication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006.Description: v.: digitalISBN:- 9783540274537
- TA417.23 B48 2006
Item type | Current library | Call number | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|---|---|
Libro Electrónico | Biblioteca Digital Colección Digital | TA417.23 B48 2006 (Browse shelf(Opens below)) | V : 2 | Link to resource | 1 | Available | Springer Link | BDIG00006967 |
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TA409 L46 2005 Engineering Damage Mechanics | TA409 Y68 2006 Residual Stress and Its Effects on Fatigue and Fracture | TA417.2 M67 2008 Dynamic Methods for Damage Detection in Structures | TA417.23 B48 2006 Applied Scanning Probe Methods II | TA417.23 B48 2006 Applied Scanning Probe Methods III | TA417.23 B48 2006 Applied Scanning Probe Methods IV | TA417.23 B48 2007 Applied Scanning Probe Methods V |
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