Applied Scanning Probe Methods VIII [electronic resource] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.
Material type:![Computer file](/opac-tmpl/lib/famfamfam/CF.png)
- 9783540740803
- TA417.23 B48 2008
Item type | Current library | Call number | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|---|---|
![]() |
Biblioteca Digital Colección Digital | TA417.23 B48 2008 (Browse shelf(Opens below)) | V :8 | Link to resource | 1 | Available | Springer Link | BDIG00001102 |
Browsing Biblioteca Digital shelves, Shelving location: Colección Digital Close shelf browser (Hides shelf browser)
TA417.23 B48 2007 Applied Scanning Probe Methods V | TA417.23 B48 2007 Applied Scanning Probe Methods VI | TA417.23 B48 2007 Applied Scanning Probe Methods VII | TA417.23 B48 2008 Applied Scanning Probe Methods VIII | TA417.23 B48 2008 Applied Scanning Probe Methods X | TA417.23 T66 2008 Applied Scanning Probe Methods IX | TA417.23 V55 2005 Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials |
There are no comments on this title.
Log in to your account to post a comment.