Introduction to Advanced System-on-Chip Test Design and Optimization [electronic resource] / by Erik Larsson.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Frontiers in Electronic Testing ; 29Publication details: Boston, MA : Springer, 2005.Edition: 1a edDescription: v.: digitalISBN:
  • 9780387256245
Subject(s): LOC classification:
  • TK7895.E42 L37 2005
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TK7895.E42 2005 (Browse shelf(Opens below)) Link to resource 1 Available SpringerLink BDIG00003361

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