Digital Noise Monitoring of Defect Origin [electronic resource] / by Telman Aliev.
Material type: Computer filePublication details: Boston, MA : Springer Science+Business Media, LLC, 2007.Edition: 1a edDescription: v.: digitalISBN:- 9780387717548
- TK7867.5 A45 2007
Item type | Current library | Call number | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|---|---|
Libro Electrónico | Biblioteca Digital Colección Digital | TK7867.5 A45 2007 (Browse shelf(Opens below)) | BDIG00002166 | Link to resource | 1 | Available | SpringerLink | BDIG00002166 |
Browsing Biblioteca Digital shelves, Shelving location: Colección Digital Close shelf browser (Hides shelf browser)
TK7867 P37 2006 METHODOLOGY FOR THE DIGITAL CALIBRATION OF ANALOG CIRCUITS AND SYSTEMS | TK7867 V44 2008 Circuit and Interconnect Design for RF and High Bit-Rate Applications | TK7867.2 B46 2006 Electromagnetic Compatibility of Integrated Circuits | TK7867.5 A45 2007 Digital Noise Monitoring of Defect Origin | TK7867.5 V37 2005 Electronic Noise and Interfering Signals | TK7868.D5 H46 2007 Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies | TK7868.D5 K47 2006 Managing Development and Application of Digital Technologies |
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