Nanometer Technology Designs High-Quality Delay Tests [electronic resource] / by Mohammad Tehranipoor, Nisar Ahmed.
Material type:![Computer file](/opac-tmpl/lib/famfamfam/CF.png)
- 9780387757285
- TK7874 T44 2008
Item type | Current library | Call number | URL | Copy number | Status | Notes | Date due | Barcode | |
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Biblioteca Digital Colección Digital | TK7874 T44 2008 (Browse shelf(Opens below)) | Link to resource | 1 | Available | SpringerLink | BDIG00002753 |
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TK7874 S74 2006 Analog Circuit Design | TK7874 S84 2007 Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging | TK7874 T36 2008 Wafer Level 3-D ICs Process Technology | TK7874 T44 2008 Nanometer Technology Designs High-Quality Delay Tests | TK7874 V36 2005 Systematic Modeling and Analysis of Telecom Frontends and Their Building Blocks | TK7874 Z33 2008 Magnetic Heterostructures Advances and Perspectives in Spinstructures and Spintransport / | TK7874.53 N87 2005 Interconnect-Centric Design for Advanced SoC and NoC |
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