The Proceedings of the international conference on methodologies of patten recognition : held at honolulu, hawai : january24-26, 1986 / Edited by Satosi Watanabe.
Material type:
TextPublication details: New York : Academic press, 1969Edition: 1a edDescription: 578 p. : íl. ; 23 cmSubject(s): LOC classification: - QA76.5 P76 1969
| Item type | Current library | Call number | Copy number | Status | Notes | Date due | Barcode | |
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Libro
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Biblioteca de la Facultad de Físico Matemáticas General | QA76.5 P76 1969 C:1 (Browse shelf(Opens below)) | C:1 | Available | Solo para Lectura | FFM000006947 |
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