Quantitative X-ray diffractometry / Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik
Material type:
TextPublication details: New York : Springer, 1987Edition: 1a edDescription: xvii, 372 p. : il. ; 24 cmISBN: - 0387945415
- QC482.D5 Z48 1995
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Libro
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Biblioteca del Instituto de Investigación en Metalurgia y Materiales General | QC482.D5 Z48 1995 (Browse shelf(Opens below)) | 1 | Available | BIIM000000303 |
Browsing Biblioteca del Instituto de Investigación en Metalurgia y Materiales shelves, Shelving location: General Close shelf browser (Hides shelf browser)
| QC482.D5 C85 r1967 Elements of x-ray diffraction | QC482.D5 C85 r1967 Elements of x-ray diffraction | QC482.D5 K58 1974 X-ray diffraction procedures for plolycrystalline and amorphous materials | QC482.D5 Z48 1995 Quantitative X-ray diffractometry | QC482.S6 J46 r1976 An introduction to X-ray spectrometry | QC522 E54 1981 Electricidade e Electromagnetismo / | QC523 M35 r1992 Física del estado solido y de semiconductores |
Bibliografía : p. 355-364 e índice
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