Lall, Pradeep <br/><br/>
Influence of temperature on microelectronics and system reliability / 
Pradeep Lall, Michael G. Pecht, Edward B. Hakim 
 - Boca Raton, Florida :  CRC,  1995 
 - 307 p. ;  26 cm. 
<br/><br/> 1 ejem.  Rec. Prop. Esc. 
<br/><br/>Incluye bibliografia e indice 
<br/><br/><label>ISBN: </label>0-8493-9450-3 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronica--Materiales--Propiedades Termicas
<br/><br/><label>LC Class. No.: </label>TK7870.25  / L35 1995