TY  - DATA
AU  - Kalinin,Sergei
AU  - Gruverman,Alexei
ED  - SpringerLink (Online service)
TI  - Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale 
SN  - 9780387286686
AV  - QH212.S33 K35 2007
PY  - 2007///
CY  - New York, NY
PB  - Springer Science+Business Media, LLC
KW  - Chemistry
KW  - Microscopy
KW  - Particles (Nuclear physics)
KW  - Mechanical engineering
KW  - Nanotechnology
KW  - Surfaces (Physics)
KW  - Characterization and Evaluation of Materials
KW  - Surfaces and Interfaces, Thin Films
KW  - Biological Microscopy
KW  - Mechanical Engineering
KW  - Solid State Physics and Spectroscopy
UR  - http://dx.doi.org/10.1007/978-0-387-28668-6
ER  -