CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test / [electronic resource] :
by Andrei Pavlov, Manoj Sachdev.
- 1a ed.
- Dordrecht : Springer Netherlands, 2008.
- v.: digital
- Frontiers In Electronic Testing, 40 0929-1296 ; .
9781402083631
Semiconductores complementarios de óxido metálico --Diseño Memoria de acceso aleatorio Nanoelectrónica