Gusev, Evgeni. <br/><br/>
Defects in High-k Gate Dielectric Stacks  Nano-Electronic Semiconductor Devices /  [electronic resource] : 
edited by Evgeni Gusev. 
 - 1a ed. 
 - Dordrecht :  Springer,  2006. 
 -  v.: digital 
 - NATO Science Series II: Mathematics, Physics and Chemistry,  220  1568-2609 ; .
<br/><br/><label>ISBN: </label>9781402043673 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Engineering<br/>Condensed matter<br/>Electronics<br/>Engineering<br/>Electronic and Computer Engineering<br/>Condensed Matter<br/>Physics and Applied Physics in Engineering<br/>Electronics and Microelectronics, Instrumentation
<br/><br/><label>LC Class. No.: </label>TK7895.G36  / G36 2006