Tehranipoor, Mohammad. <br/><br/>
Nanometer Technology Designs High-Quality Delay Tests  [electronic resource] / 
by Mohammad Tehranipoor, Nisar Ahmed. 
 - 1a ed. 
 - Boston, MA :  Springer US,  2008. 
 -  v.: digital 
<br/><br/><label>ISBN: </label>9780387757285 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Engineering<br/>Circuitos integrados--Pruebas<br/>Circuitos integrados  --Integración a muy gran escala.<br/>Nanotecnología
<br/><br/><label>LC Class. No.: </label>TK7874   / T44 2008