The Proceedings of the international conference on methodologies of patten recognition : held at honolulu, hawai : january24-26, 1986 /  
Edited by Satosi Watanabe. 
 - 1a ed. 
 - New York :  Academic press,   1969 
 - 578 p. :  íl. ;  23 cm. 
<br/><br/>Incluye índice 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Procesamiento electronico de datos
<br/><br/><label>LC Class. No.: </label>QA76.5   / P76 1969