Applied Rasch Measurement: A Book of Exemplars [electronic resource] : Papers in Honour of John P. Keeves / edited by Rupert Maclean, Ryo Watanabe, Robyn Baker, Boediono, Yin Cheong Cheng, Wendy Duncan, John Keeves, Zhou Mansheng, Colin Power, J. S. Rajput, Konai Helu Thaman, Sivakumar Alagumalai, David D. Curtis, Njora Hungi.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4Publication details: Dordrecht : Springer, 2005.Description: v.: digitalISBN:
  • 9781402030765
Subject(s): LOC classification:
  • LB3051  M33 2005
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number Vol info URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital LB3051 M33 2005 (Browse shelf(Opens below)) BDIG00003313 Link to resource 1 Available SpringerLink BDIG00003313

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