000 01138nmm a22003375u 4500
999 _c23221
_d23221
005 20200526213508.0
008 100301s2008 xx j eng d
020 _a9780387751092
050 0 4 _aTK7872.T55
_bP45 2008
100 1 _aPelliccione, Matthew.
245 1 0 _aEvolution of Thin Film Morphology
_h[electronic resource] :
_bModeling and Simulations /
_cby Matthew Pelliccione, Toh-Ming Lu.
260 _aNew York, NY :
_bSpringer-Verlag New York,
_c2008.
300 _bv.: digital
440 0 _aMaterials Science,
_x0933-033X ;
_v108
650 0 _aChemistry
650 0 _aOptical materials
650 0 _aChemistry, inorganic
650 0 _aSurfaces (Physics)
650 1 4 _aChemistry
650 2 4 _aSurfaces and Interfaces, Thin Films
650 2 4 _aOptical and Electronic Materials
650 2 4 _aTribology, Corrosion and Coatings
700 1 _aLu, Toh-Ming.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
856 4 0 _uhttp://dx.doi.org/10.1007/978-0-387-75109-2
942 _2lcc
_cLIE