Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices [electronic resource] / edited by Josef Sikula, Michael Levinshtein.

By: Sikula, JosefContributor(s): Levinshtein, Michael | SpringerLink (Online service)Material type: Computer fileComputer fileSeries: NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry, 151Publisher: Dordrecht : Springer Science + Business Media, Inc., 2005Description: v.: digitalISBN: 9781402021701Subject(s): Physics | Weights and measures | Optical materials | Physics | Optical and Electronic Materials | Electronic and Computer Engineering | Measurement Science, InstrumentationLOC classification: TK7867.5 | S55 2005Online resources: Click here to access online In: Springer eBooks
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Item type Current location Call number URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital
Responsable: Alejandra Vargas Mejía
Colección Digital
TK7867.5 S55 2005 (Browse shelf) Link to resource 1 Available SpringerLink BDIG00003156

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