Synthetic Polymeric Membranes [electronic resource] : Characterization by Atomic Force Microscopy / by K. C. Khulbe, C. Y. Feng, Takeshi Matsuura.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Springer LaboratoryPublication details: Berlin, Heidelberg : Springer-Verlag, 2008.Description: v.: digitalISBN:
  • 9783540739944
Subject(s): LOC classification:
  • TP159.M4  K48 2008
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TP159.M4 K48 2008 (Browse shelf(Opens below)) Link to resource 1 Available Springerlink BDIG00012752

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