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1.
Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe. by
Edition: Third Edition.
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008
In: Springer eBooks
Online resources:
Availability: No items available.

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2.
Spectroscopic Properties of Rare Earths in Optical Materials [electronic resource] / edited by Robert Hull, Jürgen Parisi, R. M. Osgood, Hans Warlimont, Guokui Liu, Bernard Jacquier. by Series: Springer Series in Materials Science ; 83
Material type: Computer file Computer file; Format: electronic
Publication details: Berlin, Heidelberg : Tsinghua University Press and Springer-Verlag Berlin Heidelberg, 2005
In: Springer eBooks
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Availability: Items available for loan: Biblioteca Digital (1)Call number: QC374 H85 2005.

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3.
Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration [electronic resource] / by J. Laconte, D. Flandre, J. -P. Raskin. by
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer, 2006
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: QC168 L33 2006.

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4.
Materials for Information Technology [electronic resource] : Devices, Interconnects and Packaging / edited by Ehrenfried Zschech, Caroline Whelan, Thomas Mikolajick. by Series: Engineering Materials and Processes
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: London : Springer-Verlag London Limited, 2005
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874 Z73 2005.

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