CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev.
Material type:![Computer file](/opac-tmpl/lib/famfamfam/CF.png)
- 9781402083631
- TK7871.99.M44 P38 2008
Item type | Current library | Call number | URL | Copy number | Status | Notes | Date due | Barcode | |
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Biblioteca Digital Colección Digital | TK7871.99.M44 (Browse shelf(Opens below)) | Link to resource | 1 | Available | SpringerLink | BDIG00005007 |
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