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1.
Influence of temperature on microelectronics and system reliability / Pradeep Lall, Michael G. Pecht, Edward B. Hakim by
Material type: Text Text; Format: print
Publication details: Boca Raton, Florida : CRC, 1995
Availability: Items available for loan: Biblioteca del Posgrado en Ingeniería Eléctrica (1)Call number: TK787.25 L35 1995.

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2.
Electronic packaging materials and their properties / Michael G. Pecht ... [et al]. by
Edition: 1a ed.
Material type: Text Text; Literary form: Not fiction
Publication details: Boca Raton, Fl. : CRC Press, c1998
Availability: Items available for loan: Biblioteca de la Facultad de Ingeniería Eléctrica (1)Call number: TK7870.15 E44 1999.

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3.
Guidebook for managing silicon chip reliability / Michael Pecht; Riko Radojcic; Gopal K Rao. by
Edition: 1a ed.
Material type: Text Text; Literary form: Not fiction
Publication details: Boca Raton, Fl. CRC Press, c1998
Availability: Items available for loan: Biblioteca de la Facultad de Ingeniería Eléctrica (1)Call number: TK7874 P43 1998.

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