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1.
Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor. by Series: Frontiers in Electronic Testing ; 37
Edition: 1a ed
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer-Verlag US, 2008
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: T174.7 T44 2008.

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2.
Nanometer Technology Designs High-Quality Delay Tests [electronic resource] / by Mohammad Tehranipoor, Nisar Ahmed. by
Edition: 1a ed.
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer US, 2008
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874 T44 2008.

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